An analog thin film thickness monitor
dc.contributor.advisor | Tansal, Sabih | |
dc.contributor.author | Kocagöz, Nafi | |
dc.date.accessioned | 2020-12-04T12:14:40Z | |
dc.date.available | 2020-12-04T12:14:40Z | |
dc.date.submitted | 1980 | |
dc.date.issued | 2018-08-06 | |
dc.identifier.uri | https://acikbilim.yok.gov.tr/handle/20.500.12812/83385 | |
dc.language | English | |
dc.language.iso | en | |
dc.rights | info:eu-repo/semantics/embargoedAccess | |
dc.rights | Attribution 4.0 United States | tr_TR |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
dc.subject | Elektrik ve Elektronik Mühendisliği | tr_TR |
dc.subject | Electrical and Electronics Engineering | en_US |
dc.title | An analog thin film thickness monitor | |
dc.type | masterThesis | |
dc.date.updated | 2018-08-06 | |
dc.contributor.department | Elektrik Mühendisliği Anabilim Dalı | |
dc.identifier.yokid | 10051824 | |
dc.publisher.institute | Fen Bilimleri Enstitüsü | |
dc.publisher.university | BOĞAZİÇİ ÜNİVERSİTESİ | |
dc.identifier.thesisid | 371038 | |
dc.description.pages | 67 | |
dc.publisher.discipline | Diğer |