In - Al film sisteminin spektrofotometrik ve elipsometrik yöntemle incelenmesi

dc.contributor.advisor	Özkan, Hüsnü
dc.contributor.author	Özkan, Ali
dc.date.accessioned	2021-05-07T09:04:56Z
dc.date.available	2021-05-07T09:04:56Z
dc.date.submitted	1986
dc.date.issued	2018-08-06
dc.identifier.uri	https://acikbilim.yok.gov.tr/handle/20.500.12812/605110
dc.language	Turkish
dc.language.iso	tr
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	Attribution 4.0 United States	tr_TR
dc.rights.uri	https://creativecommons.org/licenses/by/4.0/
dc.subject	Fizik ve Fizik Mühendisliği	tr_TR
dc.subject	Physics and Physics Engineering	en_US
dc.title	In - Al film sisteminin spektrofotometrik ve elipsometrik yöntemle incelenmesi
dc.title.alternative	Investigation of in-al film systems by spectrophotometric and ellipsometric methods
dc.type	masterThesis
dc.date.updated	2018-08-06
dc.contributor.department	Fizik Ana Bilim Dalı
dc.identifier.yokid	10039001
dc.publisher.institute	Fen Bilimleri Enstitüsü
dc.publisher.university	CUMHURİYET ÜNİVERSİTESİ
dc.identifier.thesisid	346879
dc.description.pages	46
dc.publisher.discipline	Diğer

Except where otherwise noted, this item's license is described as info:eu-repo/semantics/openAccess