Characterization and imaging of single layered materials by the lamb wave lens

dc.contributor.advisor	Atalar, Abdullah
dc.contributor.author	Değertekin, F.Levent
dc.date.accessioned	2020-12-02T12:52:10Z
dc.date.available	2020-12-02T12:52:10Z
dc.date.submitted	1991
dc.date.issued	2018-08-06
dc.identifier.uri	https://acikbilim.yok.gov.tr/handle/20.500.12812/37465
dc.description.abstract
dc.description.abstract		en_US
dc.language	English
dc.language.iso	en
dc.rights	info:eu-repo/semantics/embargoedAccess
dc.rights	Attribution 4.0 United States	tr_TR
dc.rights.uri	https://creativecommons.org/licenses/by/4.0/
dc.subject	Elektrik ve Elektronik Mühendisliği	tr_TR
dc.subject	Electrical and Electronics Engineering	en_US
dc.title	Characterization and imaging of single layered materials by the lamb wave lens
dc.title.alternative	Tek katmanlı malzemelerin lamd dalgası merceği ile tanımlanması ve görüntülenmesi
dc.type	masterThesis
dc.date.updated	2018-08-06
dc.contributor.department	Diğer
dc.subject.ytm	Layered material characterization
dc.subject.ytm	Lamb wave lens
dc.subject.ytm	Microscope
dc.subject.ytm	Scanning acoustic microscope
dc.identifier.yokid	14673
dc.publisher.institute	Mühendislik ve Fen Bilimleri Enstitüsü
dc.publisher.university	İHSAN DOĞRAMACI BİLKENT ÜNİVERSİTESİ
dc.identifier.thesisid	14673
dc.description.pages	39
dc.publisher.discipline	Diğer

Except where otherwise noted, this item's license is described as info:eu-repo/semantics/embargoedAccess