Minority carrier lifetime measurements in silicon samples via photoconductive decay method

dc.contributor.advisor	Sarıtaş, M.
dc.contributor.author	Semen, Kemal Ersin
dc.date.accessioned	2020-12-10T12:08:41Z
dc.date.available	2020-12-10T12:08:41Z
dc.date.submitted	1983
dc.date.issued	2018-08-06
dc.identifier.uri	https://acikbilim.yok.gov.tr/handle/20.500.12812/278410
dc.language	English
dc.language.iso	en
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	Attribution 4.0 United States	tr_TR
dc.rights.uri	https://creativecommons.org/licenses/by/4.0/
dc.subject	Elektrik ve Elektronik Mühendisliği	tr_TR
dc.subject	Electrical and Electronics Engineering	en_US
dc.title	Minority carrier lifetime measurements in silicon samples via photoconductive decay method
dc.type	masterThesis
dc.date.updated	2018-08-06
dc.contributor.department	Elektrik Mühendisliği Anabilim Dalı
dc.subject.ytm	Minority carrier
dc.subject.ytm	Silicones
dc.subject.ytm	Photoconductivity
dc.identifier.yokid	10039678
dc.publisher.institute	Fen Bilimleri Enstitüsü
dc.publisher.university	ORTA DOĞU TEKNİK ÜNİVERSİTESİ
dc.identifier.thesisid	362137
dc.description.pages	80
dc.publisher.discipline	Diğer

Except where otherwise noted, this item's license is described as info:eu-repo/semantics/openAccess